2002-2005

67]           “Measuring thin film and multilayer elastic constants by coupling in situ tensile testing with x-ray diffraction”, BADAWI K.F., VILLAIN P., GOUDEAU P., RENAULT P.-O., APPLIED PHYSICS LETTERS 80 (25) (2002) 4705-4707. Virtual Journal of Nanoscale Science & Technology 6 (1) (2002)

68]           "Residual stress states in sputtered Ti_1-xSi_xN_y films”, VAZ F., REBOUTA L., GOUDEAU P., RIVIERE J.P., SCHAFFER E., KLEER G., BODMANN M., Thin Solid Films 402 (2002) 195-202.

69]           “X-ray diffraction measurement of the Poisson’s ratio in Mo sublayers of Mo/Ni multilayers”, VILLAIN P., RENAULT P.O., GOUDEAU P., BADAWI K.F., Thin solid films 406 (2002) 185-189.

70]           “X-ray diffraction study of thin film elastic properties”, VILLAIN P., GOUDEAU P., RENAULT P.O., BADAWI K.F., Advanced engineering materials 4 (8) (2002) 554-557.

71]           “Qualitative x-ray analysis of residual stress in NdNiO3 thin film with metal-insulator transition”, ZAGHRIOUI M., LAFFEZ P., GOUDEAU P., THIAUDIERE D., Journal of materials sciences letters 21 (2002) 1379-1383.

72]           “Study by complementary X-ray techniques of in-depth microstructure in Ni-based superalloy after Pt diffusion treatment”, BENOIST J., GIRARDEAU T., GOUDEAU P., BADAWI K. F., TRAVERSE A., Surface and Coatings Technology 161 (2-3) (2002) 200-209.

73]           “Physical and morphological characterization of reactively magnetron sputtered TiN films “, VAZ F., MACHADO P., MENDES J. A., LANCEROS-MENDEZ S., CUNHA L., NASCIMENTO S.M.C., GOUDEAU Ph., RIVIERE J.-P., Thin Solid Films 420-421 (2002) 421-428.

74]           “Size effect on intragranular elastic constants in thin tungsten films”, VILLAIN P., GOUDEAU P., RENAULT P.O., BADAWI K.F., APPLIED PHYSICS LETTERS 81 (23) (2002) 4365-4367. Virtual Journal of Nanoscale Science & Technology 6 (24) (2002)

75]           « Détermination des contraintes internes dans une couche de zircone par diffraction des rayons X et par une approche micromécanique : influence de l'anisotropie thermoélastique », BECHADE J.-L. , BRENNER R. , GOUDEAU P. , GAILHANOU M., La revue de metallurgie paris 12 (2003) 1151-1156.

76]           "PVD grown (Ti,Si,Al)N nanocomposite coatings and (Ti,Al)N/(Ti,Si)N multilayers: structural and mechanical properties”, CARVALHO S., RIBEIRO E., REBOUTA L., PACAUD J., GOUDEAU P., RENAULT P.-O., RIVIERE J.-P., TAVARES C.J., surface and coatings technology  172 (2003) 109-116.

77]           “A Mössbauer comparative study of the local environment in metastable 304 stainless steel films depending on the preparation mode”, EYMERY J. -P., MERAKEB N., GOUDEAU P., FNIDIKI A., BOUZABATA B., Journal of Magnetism and Magnetic Materials 256 (2003) 227-236.

78]           “X-ray diffraction investigation of the relation ship between strains and metal-insulator transition in NdNiO3 thin films”, GOUDEAU P., LAFFEZ P., ZAGHRIOUI M., ELKAIM E., RUELLO P., Crystal engineering 51 (2003) 317-325.

79]           “Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films”, GOUDEAU P., VILLAIN P., Tamura N., PADMORE H. A., Applied physics letters 83 (1) (2003) 51-53.

80]           "Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data”, Renault P-O., LE BOURHIS E., VILLAIN P., GOUDEAU P., BADAWI K.F., FAURIE D., Applied Physics letters 83 (3) (2003) 473-475.

81]           “Damage mode study under tensile test of thin gold films on polyimide substrates by X-ray Diffraction and Atomic Force Microscopy”, RENAULT P-O., VILLAIN P., COUPEAU C., GOUDEAU P., BADAWI K.F., Thin Solid Films 424 (2003) 267-273.

82]           “Correlation between x-ray micro-diffraction and a developed analytical model to measure the residual stresses in suspended structures in MEMS”, RIGO S., GOUDEAU P., DESMARRES J.-M., MASRI T., PETIT J.-A., SCHMITT P., Microelectronics reliability 43 (2003) 1963-1968.

83]           “Preparation of magnetron sputtered TiN_xO_y thin films”, VAZ F., CERQUEIRA P., REBOUTA L., NASCIMENTO S.M.C., ALVES E., GOUDEAU P., RIVIERE J.-P., Surface and coatings technology 174-175 (2003) 197 - 203.

84]           “Mechanical characterization of reactively magnetron-sputtered TiN films”, VAZ F. , MACHADO P. , REBOUT L. , CERQUEIRA P. , GOUDEAU Ph. , RIVIERE J. P. , ALVES E. , PISCHOW K., Surface & coatings technology 174-175 (2003) 375 – 382.

85]           “X-ray diffraction study of residual stresses and microstructure in tungsten thin films sputter deposited on polyimide”, VILLAIN P., GOUDEAU P., LIGOT J., BENAYOUN S., BADAWI K.F., HANTZPERGUE J.-J., Journal of Vacuum Science and Technology 21 (4) (2003) 967-972.

86]           “Electronic speckle pattern interferometry for mechanical testing of thin films”, AUGULIS l., TAMULEVICIUS R., AUGULIS R., BONNEVILLE J., GOUDEAU P., TEMPLIER C., Optics and lasers in engineering 42 (2004) 1-8.

87]           “X-ray diffraction analysis of texture modification induced by ion beam irradiation in stainless steel films”, GOUDEAU P., BECHADE J.L., BOUBEKER B., RENAULT P.O., SERRARI A., EYMERY J.P., Applied surface science 228 (2004) 151-157.

88]           "Ion irradiation effects on the mechanical stability of compressed metallic thin films”, GOUDEAU P., GEORGE M., COUPEAU C., Applied physics letter 84 (6) (2004) 894-896.

89]           « Cartographie par diffraction des rayons X à l’échelle du micron des contraintes intra granulaires et des orientations cristallines d’un film d’or déposé sur une micro poutre en silicium », GOUDEAU P., RIGO S., MASRI T., PETIT J.-A., DESMARRES J.-M., TAMURA N., Matériaux et techniques 3-4 (2004) 46-50.

90]           “Elastic constants investigation by x-ray diffraction of in situ deformed metallic multi layers”, GOUDEAU P., VILLAIN P., RENAULT P.-O., BADAWI K.-F., GIRARDEAU T., Scripta Materiala (article invité) 50 (6) (2004) 723-727.

91]           « Réalisation de dépôt duplex d’alumine par UN procédé multi technique : caractérisation de la surface », HAURE T., DENOIRJEAN A., TRISTANT P., SOULESTIN B., DESMAISON J., FAUCHAIS P., LEFEZ B., HANNOYER B., CAHOREAU M., GOUDEAU P., Phys. Chem. News 16 (2004) 19-25

92]           “Evidence for two ferromagnetic iron sites in Fe-Cr-Ni thin films prepared by thermal evaporation”, MERAKEB N., EYMERY J.-P., FNIDIKI A., GOUDEAU P., BOUZABATA B., Materials Letters 58 (2004) 711-715.

93]           “Structural and corrosion behavior of stoichiometric and substoichiometric TiN thin films”, ROCHA L.A., ARIZA E., FERREIRA J., VAZ F., RIBEIRO E., REBOUTA L., ALVES E., Ramos A.R., GOUDEAU P., RIVIERE J.-P., Surface And Coatings Technology 180-181 (2004) 158-163.

94]           “Atomic environment and interfacial structural order of TiAlN/Mo multilayers”, TAVARES C.J., REBOUTA L., RIVIERE J.P., GIRARDEAU T., GOUDEAU P., ALVES E., BARRADAS N.P., Surface & Coatings Technology 187 (2004) 393– 398

95]           "Structural, optical and mechanical properties of coloured TiN_xO_y thin films”, VAZ F. , CERQUEIRA P. , REBOUTA L. , NASCIMENTO S. M. C. , ALVES E. , GOUDEAU Ph. , RIVIERE J. P. , PISCHOW K. , DE RIJK J, Thin solid films 447- 448 (2004) 449 – 454.

96]           "Atomistic calculation of size effects on elastic coefficients in nanometre-sized tungsten layers and wires”, VILLAIN P., BEAUCHAMP P., BADAWI K.-F., GOUDEAU P., RENAULT P.-O., Scripta Materiala 50 (9) (2004) 1247-1251.

97]           « Etude des constantes d’élasticité de films minces par diffraction des rayons X », VILLAIN P., RENAULT P.-O., GOUDEAU P., BADAWI K. F., La Revue De Metallurgie 2 (2004) 97-102.

98]            “Property change in ZrN_xO_y thin films : effect of the oxygen fraction and bias voltage”, VAZ F., CARVALHO P., CUNHA L., REBOUTA L., MOURA C., ALVES E., CAVALEIRO A., GOUDEAU P., RIVIERE J.-P., Thin Solid Films 469-470 (2004) 11-17.

99]           "Evidence of plastic damage in thin films around buckling structures”, COUPEAU C., GOUDEAU P., BELLIARD L., GEORGE M., TAMURA N.^, CLEYMAND F., COLIN J., PERRIN B., GRILHÉ J., Thin Solid Films 469-470 (2004) 221-226.

100]         “Measurement of thin film elastic constants by X-Ray diffraction”, FAURIE D., RENAULT P.-O., LE BOURHIS E., VILLAIN P., GOUDEAU PH., BADAWI F., Thin Solid Films 469-470 (2004) 201-205

101]        “Corrosion resistance of ZrN_xO_y thin films obtained by rf reactive magnetron sputtering”, ARIZA E., ROCHA L.A., VAZ F., CUNHA L., FERREIRA S.C., CARVALHO P., REBOUTA L., ALVES E., RAMOS A.R., GOUDEAU P., RIVIERE J.-P., Thin Solid Films 469-470 (2004) 274-281.

102]        “Characterization of hard DC-sputtered Si-based TiN coatings: the effect of composition and ion bombardment”, RIBEIRO E., REBOUTA L., CARVALHO S., VAZ F., FUENTES G.G., RODRIGUEZ R., ZAZPE M., ALVES E., GOUDEAU PH., RIVIÈRE J.P., Surface & Coatings Technology 188–189 (2004) 351– 357.

103]        “Evaluation Of The Damage In The Stainless Steel Coatings By Residual Stress Measurement” , LAAROUSSI S., BOUBEKER B., TALEA M., IDIRI M., ABOUZAID A., RENAULT P.O., GOUDEAU PH., M. J. Condensed Matter 6 (11) (2005) 100-104.

104]        “Evolution under annealing and nitrogen implantation of the mechanical properties of amorphous carbon films”, CHARVET S., LE BOURHIS E., FAURIE D., GOUDEAU P., LEJEUNE M., GERGAUD P., Thin Solid Films 482 (1-2) (2005) 318-323.

105]        “Influence of nitrogen content on the structural, mechanical and electrical properties of TiN thin films”, VAZ F., FERREIRA J., RIBEIRO E., REBOUTA L., LANCEROS-MENDEZ S., MENDES J.A., ALVES E., GOUDEAU P., RIVIERE J.-P., RIBIERO F., MOTINHO I., PISCHOW K., De RIJK J., Surface And Coatings Technology 191 (2005) 317-323.

106]        “Structural and mechanical studies of Fe-Cr thin films deposited by ion-beam sputtering”, LE BOURHIS E., GOUDEAU P., EYMERY J.-P.,  AL-KHOURY W., The European Physical Journal – Applied Physics 30 (1) (2005) 33-39.

107]        “Structural, Electrical, Optical and Mechanical Characterization of Decorative ZrO_xN_y Thin Films”, CARVALHO P., VAZ F., CUNHA L., REBOUTA L., TAVARES C.J., MOURA C., ALVES E., CAVALEIRO A., GOUDEAU PH., LE BOURHIS E., RIVIÈRE J. P., PIERSON J. F., BANAKH O., Journal Of Applied Physics 98 (023715) (2005) 1-8

108]        “Determination of elastic constants of a fibre-texture gold film by combining synchrotron X-ray diffraction and in-situ tensile testing”, FAURIE D., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., Journal Of Applied Physics 98 (093511) (2005) 1-9.

109]        “X-ray diffraction analysis of residual stresses in smooth fined-grain diamond coatings deposited on TA6V alloys for tribological applications”, GOUDEAU P., VANDENBULCKE L., MET C., DE BARROS M.I., ANDREAZZA P., THIAUDIERE D., GAILHANOU M., Surface And Coatings Technology 200 (1-4) (2005) 170-173.

110]        “X-ray diffraction analysis of the residual stress state in PVD TiN/CrN multilayer coatings deposited on tool steel, and its correlation with wear resistance”, MENDIBIDE C.,  STEYER P., ESNOUF C., GOUDEAU P., THIAUDIÈRE D., GAILHANOU M., FONTAINE J., Surface And Coatings Technology 200 (1-4) (2005) 165-169.

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