1] «Structural relaxation in sputtered Zr-Cu alloys studied by low-temperature thermal conductivity and X-ray scattering», PH. GOUDEAU, J.-C. LASJAUNIAS, A. NAUDON, A. RAVEX, O. BETHOUX, RQM-5 Proceedings, S. Steeb, H. Warlimont (eds.) Elsevier Science Publishers B.V. 1985, p663-666.

2]  «The medium range structure of hydrogenated Cu-Ti amorphous alloys studied by anomalous small-angle scattering of X-rays and neutron diffraction», P. GOUDEAU, A. NAUDON, B. RODMACQ, P. MANGIN, A. CHAMBEROD., Ncm3 proceedings, Journal de Physique, Colloque C8, supplEment au N°12, tome 46, dEcembre 1985, p479-483.

3] «A small angle X-ray scattering study of P type porous silicon», V. VEZIN, PH. GOUDEAU, A. NAUDON, ASPE-11 Proceedings, 1992, p199-202

4]  «Residual stress and microstructure of Cu/W multilayers», PH. GOUDEAU, K. F. BADAWI, A. NAUDON, N. DURAND, Mat. Res. Soc. Symp. Proc. Vol. 308, 1993, 713-718

5]    «Studying structure of metallic superlattices by «symmetric» and «asymmetric» X-ray diffraction», G. GLADYSZEWSKI, PH. GOUDEAU, K. F. BADAWI, A. NAUDON, Mat. Res. Soc. Symp. Proc. Vol. 308, 1993, 737-742

6] «Small-angle X-ray scattering of the microstructure of highly porous silicon», A. NAUDON, PH. GOUDEAU, A. HALIMAOUIAND, G. BOMCHIL, Journal de Physique IV, Colloque C8, supplément au Journal de physique I, Vol. 3, 1993, p349-352.

7] «Evolution structurale des solutions métastables formées par co-évaporation des éléments Cu et Mo», J. MIMAULT, T. GIRARDEAU, PH. GOUDEAU, K. REKLAOUI, Journal de Physique IV (1995) C3 -5, 279-284

8] « Nouvel appareillage de diffraction X pour l’analyse de l’état mécanique (contraintes et microdéformations) de films minces nanocristallins », GOUDEAU P., BADAWI K.F., NAUDON A., JAULIN M., DURAND N., BIMBAULT L., BRANGER V., Journal de Physique IV 6 (1996) C4-187-196.

9] « X-ray diffraction study of the mechanical and microstructural state of metallic thin films », BRANGER V., GOUDEAU P., BADAWI K.F., BIMBAULT L., DURAND N., Proc. ECRS4 2 (1996) 765-774.

10]  « Etude de la structure de multicouches Au/Pt par des techniques complémentaires de rayons X », BIMBAULT L., BADAWI K.F., GOUDEAU P., MIMAULT J., PROUX O., Journal de Physique IV 6 (1996) C7-43-51.

11] « A study of interdiffusion phenomena in Fe/CoNbZr multilayers », EYMERY J.P., KRISHNAN R., GOUDEAU P;, Journal de Physique IV 6 (1996) C7-173-176.

12] « Caractérisation structurale et contraintes résiduelles de films d’AlN par diffraction des rayons X », MENEAU C., ANDREAZZA P., GOUDEAU P., ANDREAZZA-VIGNOLE C., BOULMER-LEBORGNE C. , J. Phys. IV France 8 (1998) Pr5-153-161

13] « Synchrotron studies of zirconium alloy oxide layers », BECHADE J.L., BRENNER R ., DRALET R., GOUDEAU P., YVON P., Materials Science Forum 347-349 (2000) 471-476

14] « Application de la méthodologie des plans d’expériences de Taguschi à l’analyse des relations entre paramètres d’élaboration, microstructure et contraintes résiduelles dans des dépôts de platine électrolytique », CLEACH C., BADAWI K.F., VILLAIN J.P., GOUDEAU P., RAMADE C., MALIE A. , J. Phys. IV France 10 (2000) 155-162

15]  « Etude des propriétés élastiques de multicouches Mo/Ni en couplant un dispositif de traction à un diffractomètre de rayons X », VILLAIN P., RENAULT P.-O., GOUDEAU P., BADAWI K.F., J. Phys. IV France 10 (2000) 163-170

16] “Characterization of polycristalline thin film elastic properties using x-ray diffraction and mechanical methods” , GOUDEAU P., RENAULT P.-O., VILLAIN P., COUPEAU C., PELOSIN V., BOUBEKER B., BADAWI F., Le Vide: Science, Technique et Applications 54 (295) (2000) 182-184.

17] “ Residual stress mapping by micro x-ray diffraction: application to the study of thin film buckling ”, GOUDEAU P., VILLAIN P., TAMURA N., J. PHYS. IV 12 (2002) 409-416.

18]  “ Détermination du module d’Young dans des films minces de tungstène par diffraction des rayons X ”, VILLAIN P., GOUDEAU P., RENAULT P.-O., BADAWI K.F., J. Phys. IV 12 (2002) 147-153.

19]      “Macro stress mapping on thin film buckling”, GOUDEAU P., VILLAIN P., RENAULT P.-O., TAMURA N., CELESTRE R.S., PADMORE H., Materials  Science Forum 404-407 (2002) 709-714.

20]       “Elastic constant measurement in supported W/Cu multiplayer thin films by x-ray diffraction”, VILLAIN P., GOUDEAU P., RENAULT P.-O., BADAWI K.F; MaterialS  Science Forum 404-407 (2002) 791-796.

21]       “Influence of temperature on X-ray diffraction analysis of ZrO2 oxide layers formed on zirconium based alloys using a synchrotron radiation”, BECHADE J.-L.,BRENNER R., GOUDEAU P., GAILHANOU M., Materials  Science Forum 404-407 (2002) 803-808.

22]       “Elastic properties of supported polycrystalline thin films and multilayers : an X-ray diffraction study”, GOUDEAU P., VILLAIN P., RENAULT P.-O., BADAWI K.F., Materials  Science Forum 426-432 (2003) 3409-3414.

23]             “Structural and mechanical properties of stainless steel thin films elaborated by thermal evaporation and ion beam sputtering”, MERAKEB N., GOUDEAU P., EYMERY J.-P., BOUBEKER B., BOUZABATA B ., Materials  Science Forum 426-432 (2003) 3451-3456.

24]     “Application of the white/monochromatic X-ray m-diffraction technique to the study of texture and triaxial strain at the submicron level”, GOUDEAU P., TAMURA N., SPOLENAK R., PADMORE H.A., Materials Science Forum 490-491 (2005) 672-677.

25]     “New Experimental Technique for Material Instability Study“, WANG S.B., CAO Y.D., LI X.Y., GOUDEAU P., TONG J.W., Key Engineering Materials 274-276 (2004) 799-804

26]     “A Micromechanical Failure Study of AS4/PEEK Composites “, WANG S.B., DONG D.S., WANG Z.Y., GOUDEAU P., LI L.A., TONG J.W., Key Engineering Materials 274-276 (2004) 355-360

27]     “New optical strain method of three-beams interferometry and digital image processing”, LI L. A., WANG Z. Y., WANG S. B., GOUDEAU P., TONG J. W., Proceedings of SPIE - The International Society for Optical Engineering Volume 5852 PART II (2005) 745-750.

28]             “Mechanical properties and size effect in nanometric W/Cu multilayers”, VILLAIN P., FAURIE D., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., BADAWI K.-F., Mater. Res. Soc. Symp. Proc.  875 (01.3) (2005) 1-6.

29]    “A microtensile set up for characterising the mechanical properties of films”, CYZIUTE B., AUGULIS L., BONNEVILLE J., GOUDEAU P., LAMONGIE B., TAMULEVICIUS S., TEMPLIER C., Mater. Res. Soc. Symp. Proc.  875 (04.8) (2005) 1-6.

30]     “Elastic behavior of fibre-textured gold films by combining synchrotron X-ray diffraction and in-situ tensile testing”, FAURIE D., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., Mater. Res. Soc. Symp. Proc.  875 (04.7) (2005) 1-6.

31]    “X-ray diffraction characterization of suspended structures for MEMS applications”, GOUDEAU P., TAMURA N., LAVELLE B., RIGO S., MASRI T., BOSSEBOEUF A., SARNET T., PETIT J.-A., DESMARRES J.-M., Mater. Res. Soc. Symp. Proc.  875 (04.11) (2005) 1-6.

32]    “Gold leaf decoration on medieval islamic glazed ceramics – In search of technological features with XRD”, PACHECO C., CHAPOULIE R., DOORHYÉE E., GOUDEAU PH., Z. Kristallogr. Suppl. 26 (2007) 317-323

33]     “White beam microdiffraction experiments for the determination of the local plastic behaviour of polycrystals”, CASTELNAU O., GOUDEAU P., GEANDIER G., TAMURA N., BÉCHADE J.L. , BORNERT M., CALDEMAISON D., Material science forum 524-525 (2006) 103-108.

34]     “Strains, stresses and elastic properties in polycrystalline metallic thin films: in situ deformation combined with x-ray diffraction and simulation experiments”, GOUDEAU P., FAURIE D., GIRAULT B., RENAULT P.-O., LE BOURHIS E., VILLAIN P., BADAWI F., CASTELNAU O., BRENNER R., BECHADE J.-L., GEANDIER G., TAMURA N., Material science forum 524-525 (2006) 735-740.

35]    “Experimental study of size-effects on the mechanical properties of nanometric W/Cu multilayers”, VILLAIN P., GIRAULT B., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., BADAWI K.-F., Mater. Res. Soc. Symp. Proc.  977 (FF7.1) (2007) 1-6.

36]     “Study of texture effect on elastic properties of Au thin films by x-ray diffraction and Brillouin light scattering”, FAURIE D., DJEMIA P., RENAULT P. –O., ROUSSIGNÉ Y., CHÉRIF S. M., LE BOURHIS E., GOUDEAU PH., Journal of Physics: Conference Series 92 (012170) (2007) 1-4.

37]     “Gold leaf decoration on medieval islamic glazed ceramics - in search of technological features with XRD”, Pacheco C., Chapoulie R., Dooryhee E., Goudeau P., ZEITSCHRIFT FUR KRISTALLOGRAPHIE  Supplement: 26   Pages: 317-323   Part: Part 2   Published: 2007

38]    “Elastic properties of metallic thin films : 2D synchrotron XRD analysis and in situ tensile testing”, GEANDIER G., RENAULT P.-O., GOUDEAU PH., LE BOURHIS E., GIRAULT B., Advances in X-ray analysis 51 (2008) 169-175.

39]    “Micro scanning XRF, XANES and XRD studies of the decorated surface of Roman Terra Sigillata ceramics”, MIRGUET C., SCIAU P., GOUDEAU P., METHA A., PIANETTA P., LIU Z., TAMURA N., Advances in X-ray analysis 51 (2008) 242-248.

40]   “Study of Elastic Behavior of Metallic Thin Films by 2D Synchrotron XRD and in situ Tensile Testing”, Le Bourhis E., Geandier G., Renault P.-O., Goudeau P., Girault B., Mater. Res. Soc. Symp. Proc. 1027 (D01-09) (2008) 1-6.

41]    “Size effects on the mechanical behavior of nanometric W/Cu multilayers”, GIRAULT B., GOUDEAU P., LE BOURHIS E., RENAULT P-O., VILLAIN P., ALLARD F., GEANDIER G., Mater. Res. Soc. Symp. Proc. 1086 (U04-04) (2008) 1-6.

42]     “Development of the electronic speckle pattern interferometry and mark tracking techniques for the elastic properties of polymers and coated polymers”, Abakeviciene B., Tamulevicius S., Bonneville J. Templier C., Goudeau P., Cyviene J., Slapikas K., MECHANIKA 2008, PROCEEDINGS  Book Series: Mechanika Kaunas University of Technology, pages: 10-16

43]         “Effet  de  structure  et  de  taille  sur  les  propriétés mécaniques  de  multicouches  métalliques nanométriques“ , GIRAULT B., GEANDIER G., RENAULT P.-O., EYIDI D., LE BOURHIS E., ALLARD F., VALAT P., GOUDEAU P., Actes de CFM’09, N° ISSN 2103-6225, (2009) 1-6.

44]     “X-ray diffraction characterization of suspended structures for MEMS applications”, GOUDEAU P., GEANDIER G., TAMURA N., Actes de CFM’09, N° ISSN 2103-6225, (2009) 1-6.

45]    “Development of a biaxial tensile module at synchrotron beamline for the study of mechanical properties of nanostructured films”, LE BOURHIS E., GIRAULT B., RENAULT P.-O., GOUDEAU P., GEANDIER G., THIAUDIERE D., RANDRIAMAZAORO R. N., CHIRON R., FAURIE D., CASTELNAU O., Mater. Res. Soc. Symp. Proc. 1224, GG03-08 (2010)

46]    “Residual Stresses in Sputtered ZnO Films on (100) Si Substrates by XRD”
CONCHON F., RENAULT P-O., GOUDEAU P., LE BOURHIS E., SONDERGARD E., BARTHEL E., GRACHEV S., GOUARDES E., RONDEAU V., GY R., LAZZARI R., JUPILLE J., BRUN N. Mater. Res. Soc. Symp. Proc. 1201, H05-03 (2010)

47]    “Mechanical properties of PVD Al_1-xCr_xN thin films”Pham T.T.H., Le Bourhis E., Goudeau P., Guérin P.Matériaux & Techniques 99 (2011) 239-244.

48]    “Measurement of applied strains in thin films onto polymer by synchrotron X-ray diffraction”, Renault P.O., Djaziri S., Le Bourhis E., Goudeau Ph., Faurie D., Thiaudière D., Hild F. Procedia Engineering 10 (2011) 2701–2706.

49]     “Elastic strains in He implanted UO2 polycrystalline sample: micro X-ray Laue diffraction measurements and anisotropic elastic modeling”, GOUDEAU Ph., CASTELIER É., PALANCHER H., RICHARD A., MICHA J-S., MRS proceedings (2013). MRS Proceedings / Volume  1514 / 2013 / pp. 125-130.

50]     “Relationship between Nitrogen Content and Mechanical Properties in Al1-xCrxNy Thin Films», PHAM T.T.H.,  PAUMIER F., LE BOURHIS E., GOUDEAU P., Materials Science Forum 761 (2013) 165-170.

51]      "Déformations élastiques dans des échantillons polycristallins d'UO2 implantées en hélium: mesures par micro diffraction Laue et modélisation élastique", CASTELIER E., PALANCHER H., RICHARD A.,, MICHA S., GOUDEAU P.,  Actes du Congrès Français de Mécanique (CFM 2013) 6 pages.

52]     “Strain measurement in helium implanted polycrystal using image analysis on Laue micro x-ray diffraction pattern” , IBRAHIM M., CASTELIER É., PALANCHER H., RICHARD  A., GOUDEAU  P., BORNERT  M., S. CAREC, PhotoMechanics 2013

53]     " Time-resolved X-ray stress analysis in multilayered thin films during continuous loading: use of 2D remote detection”, GUILLOU R., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., GODARD P., FAURIE D., GEANDIER G., MOCUTA C., THIAUDIÈRE D., Advanced Materials Research 996 (2014) 878-883.

54]      “Modeling of stress and strain fields induced during the Smart-Cut process on silicone. Influence of different couplings including diffusion of hydrogen and damage at a microscopic scale”, ZHAO Y., LABERGE K., GROSSEAU-POUSSARD J.-L., PANICAUD B., GOUDEAU P., Advanced Materials Research 996 (2014) 707-712.

55]    “External reference samples for residual stress analysis by X-ray diffraction”, LEFEBVRE F., WASNIEWSKI E., FRANCOIS M., CACOT J., LE-BEC P., BAUMHAUER E., BOUSCAUD D., BERGEY T., BLAIZE D., GLOAGUEN D., COSSON A., JEGOU S., CHEYNET Y., LERAY S., MEHEUX M., MONVOISIN JC., ALLAIN P., VIDAL JM., SPRAUEL JM., GOUDEAU P., CHARLES C., DAFLON L., FISCHER C., DESMAS L., OUAKKA A., MOYA MJ., BORDIEC Y., HAMDI H., Advanced Materials Research 996 (2014) 221-227.

56]     “Use of Raman Spectroscopy and Synchrotron micro-Diffraction to investigate stress in thermal oxide films : a multiscale approach”, GROSSEAU-POUSSARD J.L., GUERAIN M., GOUDEAU P., GEANDIER G., PANICAUD B., TAMURA N., KUNZ M., DEJOIE C., MICHA J.S., Advances in Science and Technology 91 (2014) 100-107.

57]      "Strains in Thermally Growing Cr2O3 Films Measured In Situ Using Synchrotron X-Rays", RAKOTOVAO F., TAO Z., PANICAUD B.,  GROSSEAU-POUSSARD J.-L., GEANDIER G. , RENAULTP.-O., GOUDEAU P. , BOUDET N., BLANC N., VITOUX H.,GORGES B., Materials Science Forum 905 (2017) 52-59.

Haut de page