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CNRS senior researcher
P' InstituteUPR 3346, CNRS/Poitiers University/ENSMA
"Physics and Mechanics of Materials" Department (ex - PhyMat)
SP2MI, Téléport 2, Boulevard Marie et Pierre Curie
BP 30179, 86962 FUTUROSCOPE Chasseneuil Cedex, FRANCE
Tel. +33 5 49 49 67 58 Fax +33 5 49 49 66 92
I am research director (DR) at the French National Center for Scientific Research (CNRS). I received my PhD in 1986 followed by an HDR in 1994 from the University of Poitiers where I worked for ten years on the application of anomalous small angle x-ray scattering for the study of heterogeneities in metallic alloys and porous silicon. My current research interest include the study of size effects on thin film elastic properties using specific X-ray diffraction tools developed at the laboratory and at synchrotron sources such as ALS Berkeley (USA), ESRF Grenoble (France) and SOLEIL Paris (France).
I authored or co-authored more than 170 international peer review publications [co editor of Rayons X et Matière series (Lavoisier) 2006, 2007 and 2009 (English version with Wiley) and of Nanosciences overview in North – West France (International Journal of Nanotechnology)] and around 200 communications. I am engaged in the organization of the French-speaking meeting "Rayons X et Matière" (RX2006, RX2007, RX2009, RX2011, RX2013) and member of several advisory boards of national and international scientific conferences. I am reviewer of different international scientific journals - Applied Physics Letters, Science, Journal of Applied Crystallography, Journal of Applied Physics - as well as national and international scientific programs and member of the MRS (USA), ECA (Europe) and SF2M, SFP (France) scientific societies. I have been co-supervisor of 10 PhD thesis and member of more than 50 PhD and HDR jury.From September 2008 to July 2012, I chaired the "Condensed Matter: organization and dynamic" division (numbered 05) at the French national committee of the scientific research (CoNRS) and have been menber of AERES visiting commitiees. During four years (2010-2013), I was deputy director of a new laboratory called Pprime institute (540 persons) for two years and then director of the materials sciences department in Pprime institute (150 persons).
Research interests
- Size and microstructural effects on the mechanical properties in nanostructured thin films - XRD and DIC strain measurements
- Stress mapping by scanning micro diffraction at synchrotron facilities
Keywords
- Nanostructured thin films, Mechanical properties, Synchrotron X-ray diffraction, In-situ tensile testing.
Selected publications (10 past years)
* FAURIE D., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., “Determination of elastic constants of a fibre-texture gold film by combining synchrotron X-ray diffraction and in-situ tensile testing”, JOURNAL OF APPLIED PHYSICS 98 (093511) (2005) 1-9.
* FAURIE D., RENAULT P.O., LE BOURHIS E., GOUDEAU PH., CASTELNAU O., BRENNER R., “Elastic behavior of polycrystalline thin films inferred from in situ micromechanical testing and modeling”, APPLIED PHYSICS LETTERS 89 (061911) (2006) 1-3.
* AL KHOURY W., EYMERY J.-P., GOUDEAU P., “Phase transformation of the A15 metastable phase of Fe-Cr thin films prepared by ion-beam sputtering”, JOURNAL OF APPLIED PHYSICS 102 (043511) (2007) 1-10.
* GEANDIER G., RENAULT P.-O., TEAT S., LE BOURHIS E, LAMONGIE B., GOUDEAU PH., "Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior", JOURNAL OF APPLIED CRYSTALLOGRAPHY 41 (6) (2008) 1076 – 1088.
* FAURIE D., CASTELNAU O., BRENNER R., RENAULT P.-O, LE BOURHIS E, GOUDEAU PH., "In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation", JOURNAL OF APPLIED CRYSTALLOGRAPHY 42 (2009) 1073-1084.
* GEANDIER G., RENAULT P.-O., LE BOURHIS E., GOUDEAU Ph., FAURIE D.,LE BOURLOT C., DJEMIA Ph., CASTELNAU O., CHERIF S. M., “Elastic-strain distribution in metallic film-polymer substrate composites”, APPLIED PHYSICS LETTERS 96, 041905 (2010) - Virtual Journal of Nanoscale Science & Technology 21 (6) (2010)
* GIRAULT B., EYIDI D., CHAUVEAU T., BABONNEAU D., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., “Copper coverage effect on tungsten crystallites texture development in W/Cu nano-composite thin films”, JOURNAL OF APPLIED PHYSICS 109, 014305 (2011) 12 pages
* RICHARD A., PALANCHER H., CASTELIER E., MICHA J.-S., GAMALERI M., CARLOT G., ROUQUETTE H., GOUDEAU P., MARTIN G., RIEUTORD F., PIRON J. P., GARCIA P., “Strains in light-ion-implanted polycrystals: influence of grain orientation”, JOURNAL OF APPLIED CRYSTALLOGRAPHY (2012). 45, 826–833.
* PHAM T., FAURIE D., DJEMIA P., BELLIARD L., LE BOURHIS E., GOUDEAU P., PAUMIER F., “Phase transition signature on elastic constants in al1-xcrxny ternary alloys thin films”, APPLIED PHYSICS LETTERS 103, 041601 (2013).
* JIA H.K., WANG S.B., LI L.A., WANG Z.Y., GOUDEAU P., « Application of optical 3D measurement on thin film buckling to estimate interfacial toughness”, OPTICS AND LASERS IN ENGINEERING 54 (2014) 263–268.