1985 - 1995

1]              "Diffusion centrale anomale sur des zones de Guinier-Preston dans l'alliage aluminium-zinc", P. GOUDEAU, A. NAUDON, A. FONTAINE ET C.E. WILLIAMS, J. Physique Lett. (1985). 46, 255-259

2]              "Anomalous Small-Angle X-ray Scattering in Metallurgy: a Feasibility Experiment with an Al-Zn Alloy", PH. GOUDEAU, A. FONTAINE, A. NAUDON AND C.E. WILLIAMS, J. Appl. Cryst. (1986). 19, 19-24

3]              "On the nature of the heterogeneities in a hydrogenated Cu-Ti amorphous: An ASXAS study", P. GOUDEAU, A. NAUDON, A. CHAMBEROD, B. RODMACQ AND C.E. WILLIAMS, Europhys. Lett. (1987). 3 (3), 269-275

4]              "Neutron Diffraction Study of the Crystallization of Hydrogenated Cu-Ti Amorphous Alloys", B. RODMACQ, P. GOUDEAU, J. PANNETIER AND A. CHAMBEROD, Materials Sciences and Engineering, (1988). 97, 391-394

5]              "Small angle X-ray scattering study of the decomposition process of the powder metallurgy alloy Cu-15wt%Ni-8wt%Sn", PH. GOUDEAU, A. NAUDON AND J.-M. WELTER, Scripta Metallurgica (1988). 22 (7), 1019-1022

6]              "New Apparatus for Grazing X-ray Reflectometry in the Angle-Resolved Dipersive Mode", A. NAUDON, J. CHIHAB, P. GOUDEAU AND J. MIMAULT, J. Appl. Cryst. (1989). 22, 460-464

7]              "X-ray small-angle scattering analysis of porous silicon layers", P. GOUDEAU, A. NAUDON, G. BOMCHIL AND R. HERINO, J. Appl. Phys. (1989). 66 (2), 625-628

8]              "Anomalous Small-Angle X-ray Scattering of the Early Stages of Decomposition in Cu-15wt%Ni-8wt%Sn", PH. GOUDEAU, A. NAUDON AND J.-M. WELTER, J. Appl. Cryst. (1990). 23, 266-276

9]              "Grazing Small-Angle Scattering of X-rays for the Study of Thin Surface Layers", A. NAUDON, T. SLIMANI AND P. GOUDEAU, J. Appl. Cryst. (1991). 24, 501-508

10]           "Grazing-Incidence X-ray Scattering Study of the Microstructure of Tungsten-Carbon Films", T. SLIMANI, PH. GOUDEAU, A. NAUDON, G. FARGES AND J. L. DEREP, J. Appl. Cryst. (1991). 24, 638-644.

11]           "Influence of the Doping Level on the Microstructure of P-Type Porous Silicon Studied by Small-Angle X-ray Scattering", V. VEZIN, PH. GOUDEAU, A. NAUDON, A. HERINO AND G. BOMCHIL, J. Appl. Cryst. (1991). 24, 581-587

12]           "Diffusion centrale des rayons X sous incidence rasante. Faisabilité et applications", A. NAUDON, P. GOUDEAU ET T. SLIMANI, J. Phys. I France (1992). 2, 1083-1096

13]           "Characterization of photoluminescent porous Si by small-angle scattering of X-rays", V. VEZIN, P. GOUDEAU, A. NAUDON, A. HALIMAOUI AND G. BOMCHIL, Appl. Phys. Lett. (1992). 60 (21), 2625-2627

14]           "SAXS study of the influence of the porous silicon morphology on the photoluminescence efficiency", PH. GOUDEAU, A. NAUDON, A. HALIMAOUI AND G. BOMCHIL, Journal of Luminescence (1993). 57, 141-145

15]           "Small-angle X-ray scattering study of anodically oxidized porous silicon layers", A. NAUDON, P. GOUDEAU, A. HALIMAOUI, B. LAMBERT AND G. BOMCHIL, J. Appl. Phys. (1994). 75 (2), 780-784

16]           « Correlation between the porous silicon morphology and the photoluminescence efficiency », GOUDEAU P., NAUDON A., VEZIN V., HALIMAOUI A., BOMCHIL G., LAMBERT B., PHYSICS STATUS SOLIDI B 190 (1) (1995) 63-68.

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