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2011 - 2016
150] “Copper coverage effect on tungsten crystallites texture development in W/Cu nano-composite thin” GIRAULT B., EYIDI D., CHAUVEAU T., BABONNEAU D., RENAULT P.-O., LE BOURHIS E., GOUDEAU P. films Journal of applied physics 109, 014305 (2011) 12 pages
151] “Microstructure and elastic properties of atomic layer deposited TiO2 anatase thin films” BONTEMPI E., BORGESE L., GELFI M., ZUCCA M., DEPERO L.E., GOUDEAU P., GEANDIER G., THIAUDIERE D. Acta Materiala 59 (2011) 2891-2900.
152] "X-ray strain analysis of {111} fiber-textured thin films regardless of grain-interaction models” FAURIE D., RENAULT P.-O., LE BOURHIS E., CHAUVEAU T., CASTELNAU O., GOUDEAU P. Journal Of Applied Crystallography 44 (2011) 409-413.
153] "In situ study of spin waves in thin film deposited onto compliant substrate submitted to external stresses”KARBOUL-TROJET W., FAURIE D., ROUSSIGNE Y., CHERIF S. M., RENAULT P.-O., GOUDEAU PH. Journal Of Physics D: Applied Physics 44 (15) (2011)
154] “Reverse Engineering the ancient ceramic technology based on X-ray fluorescence spectromicroscopy” SCIAU P., LEON Y., GOUDEAU P., FAKRA S., WEBB S., MEHTA A. Journal of Analytical Atomic Spectrometry 26 (2011) 969-976
155] "Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton” DJAZIRI S., RENAULT P.-O., HILD F., LE BOURHIS E., GOUDEAU P., THIAUDIERE D., FAURIE D., Journal Of Applied Crystallography 44 (2011) 1071-1079.
156] “X-ray elastic response of metallic thin film supported by polyimide substrates Invited contribution to “Strain Measurement using Synchrotron X-rays” , LE BOURHIS E., FAURIE D., RENAULT P.O., GEANDIER G., THIAUDIERE D., CASTELNAU O., GOUDEAU P. a special issue of Journal Of Strain Analysis For Engineering Design 46 (2011) 639-649.
157] “Stress release phenomena in chromia scales formed on NiCr-30 alloys: influence of metallurgical parameters” , GUERAIN M., GOUDEAU P., GROSSEAU-POUSSARD J.-L. Journal Of Applied Physics 110, 093516 (2011) 6 Pages.
2012
158] “Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition”, BONTEMPI E., GELFI M., ZUCCA M., DEPERO L.E., GOUDEAU P., GEANDIER G., THIAUDIERE D., Surface and Coatings Technology 206 (8-9) (2012) 2459-2463.
159] “Synchrotron X-ray diffraction experiments with a prototype hybrid pixel detector “C. LE BOURLOT, P. LANDOIS, S. DJAZIRI, P.-O. RENAULT, E. LE BOURHIS, P. GOUDEAU, M. PINAULT, M. MAYNE-L'HERMITE, B. BACROIX, D. FAURIE, O. CASTELNAU, P. LAUNOIS AND S. ROUZIÈRE Journal Of Applied Crystallography 45 (2012)., 38-47
160] “Deposition of ultra-thin gold film on in situ loaded polymeric substrate for 2 compression tests” RENAULT P.O., FAURIE D., LE BOURHIS E., GEANDIER G., DROUET M., THIAUDIERE D., GOUDEAU PH. Materials Letters 73 (2012) 99-102.
161] “Strains in light-ion-implanted polycrystals: influence of grain orientation”, RICHARD A., PALANCHER H., CASTELIER E., MICHA J.-S., GAMALERI M., CARLOT G., ROUQUETTE H., GOUDEAU P., MARTIN G., RIEUTORD F., PIRON J. P., GARCIA P., Journal of Applied Crystallography (2012). 45, 826–833.
162] “Experimental and numerical study of the effects of a nanocrystallisation treatment on high-temperature oxidation of a zirconium alloy”, PANICAUD, B.; RETRAINT, D., GROSSEAU-POUSSARD, J. -L., GUERAIN M., GOUDEAU P., TAMURA N., KUNZ M., Corrosion Science 60 (2012) 224-230.
2013
163] “Deformation modes of nanostructured thin film under controlled biaxial deformation”, DJAZIRI S., FAURIE D., LE BOURHIS E., GOUDEAU PH., RENAULT P.-O., MOCUTA C., THIAUDIÈRE D., HILD F., Thin Solid Films (2013) 30-34
164] “X-ray elastic strain analysis of compressed Au thin film on polymer substrate”, FAURIE D., RENAULT P.-O., LE BOURHIS E., DROUET M., GOUDEAU P., Surface and Coatings Technology (2013) 322-326.
165] “ Local stress determination in chromia-former thanks to Micro-Raman Spectroscopy : a way to investigate spontaneous delamination processes”, GUERAIN M., GROSSEAU-POUSSARD J.-L., GOUDEAU P., Journal of Applied Physics 113, 063502 (2013) –
166] “Investigation of buckling transition from straight-sided to telephone-cord wrinkles in Al films”, HAIKUN J., WANG S. B., GOUDEAU P., LI L., XUE X., Journal of Micromechanics and Microengineering 23, 045014 (2013)
167] "Controlled nanostructuration of polycrystalline tungsten thin films", GIRAULT B., EYIDI D., GOUDEAU P., SAUVAGE T., GUERIN P., LE BOURHIS E., RENAULT P.-O., Journal of Applied Physics 113, 174310 (2013)
168] “Phase transition signature on elastic constants in al1-xcrxny ternary alloys thin films”, T. PHAM, D. FAURIE, P. DJEMIA, L. BELLIARD, E. LE BOURHIS, P. GOUDEAU, F. PAUMIER, Applied Physics Letters 103, 041601 (2013)
169] “Yield surface of polycrystalline thin films as revealed by non equi-biaxial loadings at small deformation”, DJAZIRI S., FAURIE D., RENAULT P.-O., LE BOURHIS E., GOUDEAU PH., GEANDIER G., THIAUDIÈRE D., Acta Materialia 61 (2013) 5067–5077.
2014
170] “Non-equibiaxial deformation of W/Cu nanocomposite thin films on stretchable substrate: Effect of loading path”, RENAULT P.-O., LE BOURHIS E., GOUDEAU P., THIAUDIÈRE D., FAURIE D., Thin Solid Films 549 (2013) 239–244.
171] « Application of optical 3D measurement on thin film buckling to estimate interfacial toughness” JIA H.K., WANG S.B., LI L.A., WANG Z.Y., GOUDEAU P., Optics And Lasers In Engineering 54 (2014) 263–268.
172] “Multi-scale x-ray diffraction study of strains induced by He implantation in UO2 polycrystals”, RICHARD A., CASTELIER E., PALANCHER H., MICHA J.S., ROUQUETTE H., AMBARD A., GARCIA PH., GOUDEAU PH., Nuclear Instrument and Methods B 326 (2014) 251-255.
173] “Mastering the biaxial stress state in nanometric thin films on flexible substrates”, FAURIE D., RENAULT P.-O., LE BOURHIS E., GEANDIER G., DJAZIRI S., GOUDEAU P., THIAUDIÈRE D., Applied Surface Science 306 (2014) 70-74.
174] “Comparative study on the mechanical properties of nanostructured thin films on stretchable substrates”, DJAZIRI S., RENAULT P.-O., LE BOURHIS E., GOUDEAU P., FAURIE D., MOCUTA C., THIAUDIERE D., Journal of Applied Physics 116 (2014) 093504
2015
175] “Evolution of terra sigillata technology from Italy to Gaul through a multi-technique approach", LEON Y., SCIAU P., PASSELAC M., SANCHEZ C., SABLAYROLLES R., GOUDEAU P., TAMURA N., Journal of Analytical Atomic Spectrometry 30 (2015) 658–665.
176] “Ceramics in art and archaeology: a review of the materials science aspects”, SCIAU P., GOUDEAU P., Eur. Phys. J. B colloquium paper 88 (2015)132.
177] “Grain boundary sliding in chromia thermally grown oxide”, GUERAIN M., GOUDEAU P., GROSSEAU-POUSSARD J.L., Scripta Materialia 109 (2015) 15–18.
178] “Benefits of the complementary use of monochromatic and white-beam X-ray micro-diffraction for the investigation of ancient materials”, DEJOIE C., KUNZ M., TAMURA N., GOUDEAU P., SCIAU P., Journal of Applied Crystallography 48 (2015) 1522-1533.
179] “Peculiar effective elastic anisotropy of nanometric multilayers studied by surface Brillouin scattering”, FAURIE D., DJEMIA P., CASTELNAU O., BRENNER R., BELLIARD L., LE BOURHIS E., GOUDEAU PH., RENAULT P.-O., Superlattices And Microstructures 88c (2015) 551-560.
180] “Biaxial machine at Diffabs beamline for studying mechanical properties of thin films deposited onto polymer substrates”, FAURIE D., GOUDEAU P., LE BOURHIS E., RENAULT P.-O., Matériaux & Techniques 103, 610 (2015) 1-10.
2016
181] “Strain profiles in ion implanted ceramic polycrystals: a new approach based on reciprocal-space crystal selection”, PALANCHER H., GOUDEAU P., BOULLE A., RIEUTORD F., FAVRE-NICOLIN V., BLANC N., MARTIN G., FOUET J., ONOFRI C., Applied Physics Letters 108 (2016) 031903.
182] “Strain relaxation in He implanted UO2 polycrystals under thermal treatment: an in-situ XRD study”, PALANCHER H., KACHNAOUI R., RICHARD A., RICHAUD J.-C., ONOFRI C., BOULLE A., ROUQUETTE H., MARTIN G., SABATHIER C., BELIN R., CARLOT G., DESGARDIN P., SAUVAGE T., RIEUTORD F., GOUDEAU P., AMBARD A., Journal of Nuclear Materials 476 (2016) 63-76.
183] “Nano-structuration effect on the mechanical behaviour of gold thin films studied by 2D synchrotron x-ray diffraction”, GUILLOU R., LE BOURHIS E., GOUDEAU P., RENAULT P.-O, GODARD P., FAURIE D., GEANDIER G., MOCUTA C.; THIAUDIÈRE D., Surface and Coatings Technology 308 (2016) 418-423.
184] “Study on Young's modulus of thin films on Kapton by microtensile testing combined with dual DIC systems”, HE W., GOUDEAU P., LE BOURHIS E., RENAULT P.-O., DUPRÉ J.-C., DOUMALIN P., WANG S. B., Surface and Coatings Technology 308 (2016) 273-279.
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